Michael holds a PhD in synthetic organometallic chemistry from the University of California, Berkeley. Michael developed and patented the analytical techniques required for the monitoring the concentrations of organic and inorganic components of solutions used in the manufacture of semiconductor devices by electrodeposition and etching, as well as contaminants in water. As the Chief Scientist at AMS, Michael has been instrumental in the development of the broad suite of online monitors and offline analyzers offered by the company.